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Carrier mobility and scattering lifetime in electric double-layer gated few-layer graphene

机译:双电层栅极多层石墨烯的载流子迁移率和散射寿命

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摘要

We fabricate electric double-layer field-effect transistor (EDL-FET) devices on mechanically exfoliated few-layer graphene. We exploit the large capacitance of a polymeric electrolyte to study the transport properties of three, four and five-layer samples under a large induced surface charge density both above and below the glass transition temperature of the polymer. We find that the carrier mobility shows a strong asymmetry between the hole and electron doping regime. We then employ ab initio density functional theory (DFT) calculations to determine the average scattering lifetime from the experimental data. We explain its peculiar dependence on the carrier density in terms of the specific properties of the electrolyte we used in our experiments.
机译:我们在机械剥离的多层石墨烯上制造了双层电场效应晶体管(EDL-FET)器件。我们利用聚合物电解质的大电容来研究三层,四层和五层样品在聚合物的玻璃化转变温度之上和之下的大感应表面电荷密度下的传输特性。我们发现载流子迁移率在空穴和电子掺杂体系之间显示出很强的不对称性。然后,我们使用从头算密度函数理论(DFT)计算来从实验数据确定平均散射寿命。根据我们在实验中使用的电解质的特定特性,我们解释了其对载流子密度的特殊依赖性。

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